Field pattern variances: Yield impacts


Bob Recker, Cedar Valley Innovation, takes aerial images of fields and looks down to the plant level to determine the cause of field patterns and variances. This is his 9th year of foucs at the plant level. "It's been an evolving process," Recker says.

CSD writer Lynn Betts spoke with Recker about his aerial imagery and how the patterns in the corn field affect yield. He notes that while the yield monitor is a good tool, getting down to plan level to determine the cause is most beneficial. 

Read more about Recker and his plant level analysis.

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